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Making sure your IC works when you buy it:
Integrated Circuit Testing and the International Test Conference
Cost: No Charge for members. Registration is required.
Speaker: Dr. Jennifer Dworak
Abstract: Testing integrated circuits and systems for defects has never been trivial.Exhaustive testing is impossible, and test economics require testing to be fast and effective.This talk will discuss some of the work that engineers have done over the years to help minimize test escapes and reduce the odds that customers end up with defective devices.It will then cover some of the issues at the cutting edge of test today, and why they get so much attention at the International Test Conference.
NOTE: PDH certificates are available and an evaluation form will be emailed to you after the meeting. PDH certificates are sent by IEEE USA 3-4 weeks after the meeting.
Register here:
https://events.vtools.ieee.org/m/453863
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